Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniques
Identifieur interne : 004605 ( Main/Repository ); précédent : 004604; suivant : 004606Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniques
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Abstract
In this work, we applied low-impact energy secondary ion mass spectrometry (known as Sc-Ultra SIMS) and high lateral resolution (NanoSIMS50) to characterize the P3HT/PCBM (poly(3-hexylthiophene)/phenyl C61-butyric acid methyl ester bulk heterojunction photovoltaic (PV) devices. Here we report results obtained on Al/P3HT:PCBM/PEDOT:PSS/ITO (poly(3-hexylthiophene: phenyl C61-butyric acid methyl ester/poly(ethylene-dioxythiophene):poly(styrene sulfonate)/indium tin oxide) using advanced SIMS measurements to monitor 3D molecular compositions and metal/organic interface. The measurements have been performed on as-deposited as well as-annealed samples of Al/polymer interface. Blend macrophase separation and polymer/fullerene distribution have been investigated.
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<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniques</title><author><name sortKey="Audinot, J N" uniqKey="Audinot J">J.-N. Audinot</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department Science and Analysis of Materials, Public Research Centre Gabriel Lippmann, 41, rue du Brill</s1><s2>4422 Belvaux</s2><s3>LUX</s3><sZ>1 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ></inist:fA14><country>Luxembourg (pays)</country><wicri:noRegion>4422 Belvaux</wicri:noRegion></affiliation></author><author><name sortKey="Leveque, P" uniqKey="Leveque P">P. Leveque</name><affiliation wicri:level="4"><inist:fA14 i1="02"><s1>Institut d'Élecrronique du Solide et des Systèmes, Centre National de la Recherche Scientifique, Université Louis Pasteur, 23, Rue du Loess</s1><s2>67037 Strasbourg</s2><s3>FRA</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>8 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Alsace</region><settlement type="city">Strasbourg</settlement></placeName><orgName type="university">Université Strasbourg 1</orgName></affiliation></author><author><name sortKey="Bechara, R" uniqKey="Bechara R">R. Bechara</name><affiliation wicri:level="4"><inist:fA14 i1="02"><s1>Institut d'Élecrronique du Solide et des Systèmes, Centre National de la Recherche Scientifique, Université Louis Pasteur, 23, Rue du Loess</s1><s2>67037 Strasbourg</s2><s3>FRA</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>8 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Alsace</region><settlement type="city">Strasbourg</settlement></placeName><orgName type="university">Université Strasbourg 1</orgName></affiliation></author><author><name sortKey="Leclerc, N" uniqKey="Leclerc N">N. Leclerc</name><affiliation wicri:level="4"><inist:fA14 i1="03"><s1>Laboratoire d'Ingénierie des Polymères pour les Hautes Technologies, Université Louis Pasteur, Ecole Européenne de Chimie, Polymères et Matériaux, 25, Rue Becquerel</s1><s2>67087 Strasbourg</s2><s3>FRA</s3><sZ>4 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Alsace</region><settlement type="city">Strasbourg</settlement></placeName><orgName type="university">Université Strasbourg 1</orgName></affiliation></author><author><name sortKey="Guillot, J" uniqKey="Guillot J">J. Guillot</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department Science and Analysis of Materials, Public Research Centre Gabriel Lippmann, 41, rue du Brill</s1><s2>4422 Belvaux</s2><s3>LUX</s3><sZ>1 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ></inist:fA14><country>Luxembourg (pays)</country><wicri:noRegion>4422 Belvaux</wicri:noRegion></affiliation></author><author><name sortKey="Migeon, H N" uniqKey="Migeon H">H.-N. Migeon</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department Science and Analysis of Materials, Public Research Centre Gabriel Lippmann, 41, rue du Brill</s1><s2>4422 Belvaux</s2><s3>LUX</s3><sZ>1 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ></inist:fA14><country>Luxembourg (pays)</country><wicri:noRegion>4422 Belvaux</wicri:noRegion></affiliation></author><author><name sortKey="Hadziioannouc, G" uniqKey="Hadziioannouc G">G. Hadziioannouc</name><affiliation wicri:level="4"><inist:fA14 i1="03"><s1>Laboratoire d'Ingénierie des Polymères pour les Hautes Technologies, Université Louis Pasteur, Ecole Européenne de Chimie, Polymères et Matériaux, 25, Rue Becquerel</s1><s2>67087 Strasbourg</s2><s3>FRA</s3><sZ>4 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Alsace</region><settlement type="city">Strasbourg</settlement></placeName><orgName type="university">Université Strasbourg 1</orgName></affiliation></author><author><name sortKey="Heiser, T" uniqKey="Heiser T">T. Heiser</name><affiliation wicri:level="4"><inist:fA14 i1="02"><s1>Institut d'Élecrronique du Solide et des Systèmes, Centre National de la Recherche Scientifique, Université Louis Pasteur, 23, Rue du Loess</s1><s2>67037 Strasbourg</s2><s3>FRA</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>8 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Alsace</region><settlement type="city">Strasbourg</settlement></placeName><orgName type="university">Université Strasbourg 1</orgName></affiliation></author></titleStmt><publicationStmt><idno type="inist">10-0427782</idno><date when="2010">2010</date><idno type="stanalyst">PASCAL 10-0427782 INIST</idno><idno type="RBID">Pascal:10-0427782</idno><idno type="wicri:Area/Main/Corpus">003D74</idno><idno type="wicri:Area/Main/Repository">004605</idno></publicationStmt><seriesStmt><idno type="ISSN">0142-2421</idno><title level="j" type="abbreviated">Surf. interface anal.</title><title level="j" type="main">Surface and interface analysis</title></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Diffusion</term><term>Heterojunctions</term><term>SIMS</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Hétérojonction</term><term>SIMS</term><term>Diffusion(transport)</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">In this work, we applied low-impact energy secondary ion mass spectrometry (known as Sc-Ultra SIMS) and high lateral resolution (NanoSIMS50) to characterize the P3HT/PCBM (poly(3-hexylthiophene)/phenyl C61-butyric acid methyl ester bulk heterojunction photovoltaic (PV) devices. Here we report results obtained on Al/P3HT:PCBM/PEDOT:PSS/ITO (poly(3-hexylthiophene: phenyl C61-butyric acid methyl ester/poly(ethylene-dioxythiophene):poly(styrene sulfonate)/indium tin oxide) using advanced SIMS measurements to monitor 3D molecular compositions and metal/organic interface. The measurements have been performed on as-deposited as well as-annealed samples of Al/polymer interface. Blend macrophase separation and polymer/fullerene distribution have been investigated.</div></front></TEI><inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0142-2421</s0></fA01><fA02 i1="01"><s0>SIANDQ</s0></fA02><fA03 i2="1"><s0>Surf. interface anal.</s0></fA03><fA05><s2>42</s2></fA05><fA06><s2>6-7</s2></fA06><fA08 i1="01" i2="1" l="ENG"><s1>Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniques</s1></fA08><fA09 i1="01" i2="1" l="ENG"><s1>European Applications of Surface and Interface Analysis - ECASIA'09</s1></fA09><fA11 i1="01" i2="1"><s1>AUDINOT (J.-N.)</s1></fA11><fA11 i1="02" i2="1"><s1>LEVEQUE (P.)</s1></fA11><fA11 i1="03" i2="1"><s1>BECHARA (R.)</s1></fA11><fA11 i1="04" i2="1"><s1>LECLERC (N.)</s1></fA11><fA11 i1="05" i2="1"><s1>GUILLOT (J.)</s1></fA11><fA11 i1="06" i2="1"><s1>MIGEON (H.-N.)</s1></fA11><fA11 i1="07" i2="1"><s1>HADZIIOANNOUC (G.)</s1></fA11><fA11 i1="08" i2="1"><s1>HEISER (T.)</s1></fA11><fA12 i1="01" i2="1"><s1>ABEL (Marie-Laure)</s1><s9>ed.</s9></fA12><fA12 i1="02" i2="1"><s1>SUZER (Sefik)</s1><s9>ed.</s9></fA12><fA12 i1="03" i2="1"><s1>WATTS (John F.)</s1><s9>ed.</s9></fA12><fA14 i1="01"><s1>Department Science and Analysis of Materials, Public Research Centre Gabriel Lippmann, 41, rue du Brill</s1><s2>4422 Belvaux</s2><s3>LUX</s3><sZ>1 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ></fA14><fA14 i1="02"><s1>Institut d'Élecrronique du Solide et des Systèmes, Centre National de la Recherche Scientifique, Université Louis Pasteur, 23, Rue du Loess</s1><s2>67037 Strasbourg</s2><s3>FRA</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>8 aut.</sZ></fA14><fA14 i1="03"><s1>Laboratoire d'Ingénierie des Polymères pour les Hautes Technologies, Université Louis Pasteur, Ecole Européenne de Chimie, Polymères et Matériaux, 25, Rue Becquerel</s1><s2>67087 Strasbourg</s2><s3>FRA</s3><sZ>4 aut.</sZ><sZ>7 aut.</sZ></fA14><fA15 i1="01"><s1>Department of Chemistry, Bilkent University</s1><s2>Ankara</s2><s3>TUR</s3><sZ>2 aut.</sZ></fA15><fA15 i1="02"><s1>The Surface Analysis Laboratory, University of Surrey</s1><s2>Guildford, Surrey GU2 7XH</s2><s3>GBR</s3><sZ>3 aut.</sZ></fA15><fA20><s1>1010-1013</s1></fA20><fA21><s1>2010</s1></fA21><fA23 i1="01"><s0>ENG</s0></fA23><fA43 i1="01"><s1>INIST</s1><s2>18260</s2><s5>354000193780181200</s5></fA43><fA44><s0>0000</s0><s1>© 2010 INIST-CNRS. All rights reserved.</s1></fA44><fA45><s0>18 ref.</s0></fA45><fA47 i1="01" i2="1"><s0>10-0427782</s0></fA47><fA60><s1>P</s1><s2>C</s2></fA60><fA61><s0>A</s0></fA61><fA64 i1="01" i2="1"><s0>Surface and interface analysis</s0></fA64><fA66 i1="01"><s0>GBR</s0></fA66><fC01 i1="01" l="ENG"><s0>In this work, we applied low-impact energy secondary ion mass spectrometry (known as Sc-Ultra SIMS) and high lateral resolution (NanoSIMS50) to characterize the P3HT/PCBM (poly(3-hexylthiophene)/phenyl C61-butyric acid methyl ester bulk heterojunction photovoltaic (PV) devices. Here we report results obtained on Al/P3HT:PCBM/PEDOT:PSS/ITO (poly(3-hexylthiophene: phenyl C61-butyric acid methyl ester/poly(ethylene-dioxythiophene):poly(styrene sulfonate)/indium tin oxide) using advanced SIMS measurements to monitor 3D molecular compositions and metal/organic interface. The measurements have been performed on as-deposited as well as-annealed samples of Al/polymer interface. Blend macrophase separation and polymer/fullerene distribution have been investigated.</s0></fC01><fC02 i1="01" i2="3"><s0>001B60</s0></fC02><fC02 i1="02" i2="3"><s0>001B70</s0></fC02><fC02 i1="03" i2="3"><s0>001B80</s0></fC02><fC03 i1="01" i2="3" l="FRE"><s0>Hétérojonction</s0><s5>01</s5></fC03><fC03 i1="01" i2="3" l="ENG"><s0>Heterojunctions</s0><s5>01</s5></fC03><fC03 i1="02" i2="3" l="FRE"><s0>SIMS</s0><s5>02</s5></fC03><fC03 i1="02" i2="3" l="ENG"><s0>SIMS</s0><s5>02</s5></fC03><fC03 i1="03" i2="3" l="FRE"><s0>Diffusion(transport)</s0><s5>03</s5></fC03><fC03 i1="03" i2="3" l="ENG"><s0>Diffusion</s0><s5>03</s5></fC03><fN21><s1>277</s1></fN21><fN44 i1="01"><s1>OTO</s1></fN44><fN82><s1>OTO</s1></fN82></pA><pR><fA30 i1="01" i2="1" l="ENG"><s1>European Conference on Applications of Surface and Interface Analysis, ECASIA'09</s1><s2>13</s2><s3>Antalya TUR</s3><s4>2009-10-18</s4></fA30></pR></standard></inist></record>Pour manipuler ce document sous Unix (Dilib)
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